Nion UltraSTEM Electron Microscope : 無料・フリー素材/写真
Nion UltraSTEM Electron Microscope / oakridgelabnews
| ライセンス | クリエイティブ・コモンズ 表示 2.1 |
|---|---|
| 説明 | The basic principle of electron microscopy is simple: an electron beam penetrates a sample and the whole optical system is used to produce an image of the material. Thanks to the success of aberration correction, goals that were unthinkable of a few years ago are now a reality, such as the identification of single atoms in materials along with the study of their properties or 3D reconstructions of nanostructured systems and even isolated atoms. The Nion UltraSTEM is ideally suited for studying materials with atomic resolution in real space. It can produce images of crystal lattices with interatomic spacings below 0.1 nm, both in direct imaging and spectroscopy, allowing the simultaneous study of crystal structure, chemistry and even electronic and optical properties. |
| 撮影日 | 2010-03-11 13:47:24 |
| 撮影者 | oakridgelabnews |
| 撮影地 | |
| カメラ | Canon EOS 5D Mark II , Canon |
| 露出 | 0.067 sec (1/15) |
| 開放F値 | f/4.0 |
| 焦点距離 | 32 mm |